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Information card for entry 4331606
Preview
Coordinates | 4331606.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C64 H48 N4 Ni P2 S4 |
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Calculated formula | C64 H48 N4 Ni P2 S4 |
SMILES | c12c(cc3c(c1)nccn3)S[Ni]1(S2)Sc2c(cc3c(c2)nccn3)S1.c1([P+](c2ccccc2)(c2ccccc2)c2ccccc2)ccccc1.c1([P+](c2ccccc2)(c2ccccc2)c2ccccc2)ccccc1 |
Title of publication | Influence of the Substituents on the Electronic and Electrochemical Properties of a New Square-Planar Nickel-Bis(quinoxaline-6,7-dithiolate) System: Synthesis, Spectroscopy, Electrochemistry, Crystallography, and Theoretical Investigation |
Authors of publication | Ramababu Bolligarla; Samala Nagaprasad Reddy; Gummadi Durgaprasad; Vudagandla Sreenivasulu; Samar K. Das |
Journal of publication | Inorganic Chemistry |
Year of publication | 2013 |
Journal volume | 52 |
Pages of publication | 66 - 76 |
a | 26.993 ± 0.002 Å |
b | 13.2302 ± 0.0009 Å |
c | 16.4171 ± 0.0011 Å |
α | 90° |
β | 117.476 ± 0.002° |
γ | 90° |
Cell volume | 5201.6 ± 0.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0921 |
Residual factor for significantly intense reflections | 0.0804 |
Weighted residual factors for significantly intense reflections | 0.197 |
Weighted residual factors for all reflections included in the refinement | 0.2052 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.112 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4331606.html
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