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Information card for entry 4331711
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Coordinates | 4331711.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | As F11 H3 N Te |
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Calculated formula | As F11 H3 N Te |
Title of publication | Syntheses of [F5TeNH3][AsF6], [F5TeN(H)Xe][AsF6], and F5TeNF2and Characterization by Multi-NMR and Raman Spectroscopy and by Electronic Structure Calculations: The X-ray Crystal Structures of α- and β-F5TeNH2, [F5TeNH3][AsF6], and [F5TeN(H)Xe][AsF6] |
Authors of publication | Fir, Barbara; Whalen, J. Marc; Mercier, Hélène P. A.; Dixon, David A.; Schrobilgen, Gary J. |
Journal of publication | Inorganic Chemistry |
Year of publication | 2006 |
Journal volume | 45 |
Journal issue | 5 |
Pages of publication | 1978 - 1996 |
a | 6.6397 ± 0.0002 Å |
b | 17.0068 ± 0.0001 Å |
c | 11.1684 ± 0.0003 Å |
α | 90° |
β | 105.636 ± 0.002° |
γ | 90° |
Cell volume | 1214.47 ± 0.05 Å3 |
Cell temperature | 164 ± 2 K |
Ambient diffraction temperature | 164 ± 2 K |
Number of distinct elements | 5 |
Space group number | 11 |
Hermann-Mauguin space group symbol | P 1 21/m 1 |
Hall space group symbol | -P 2yb |
Residual factor for all reflections | 0.0335 |
Residual factor for significantly intense reflections | 0.0271 |
Weighted residual factors for significantly intense reflections | 0.0735 |
Weighted residual factors for all reflections included in the refinement | 0.0763 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.064 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4331711.html
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