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Information card for entry 4331755
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Coordinates | 4331755.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | η^2^-[1,1,1,3,3,5,5,5-Octamethyl-2,4-bis(trimethylsilyl)pentasilane- 2,4-diolato]-η^1^-dimethyl-titanium |
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Formula | C16 H48 O2 Si7 Ti |
Calculated formula | C16 H48 O2 Si7 Ti |
SMILES | [Ti]1(O[Si]([Si]([Si]([Si](C)(C)C)([Si](C)(C)C)O1)(C)C)([Si](C)(C)C)[Si](C)(C)C)(C)C |
Title of publication | Trisilane-1,3-diolato Complexes of Ti and Zr: Syntheses and X-ray Crystal Structures† |
Authors of publication | Krempner, C.; Köckerling, M.; Reinke, H.; Weichert, K. |
Journal of publication | Inorganic Chemistry |
Year of publication | 2006 |
Journal volume | 45 |
Journal issue | 8 |
Pages of publication | 3203 - 3211 |
a | 10.084 ± 0.0003 Å |
b | 10.1608 ± 0.0003 Å |
c | 15.8011 ± 0.0005 Å |
α | 79.403 ± 0.002° |
β | 88.393 ± 0.002° |
γ | 86.56 ± 0.002° |
Cell volume | 1588.29 ± 0.08 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0275 |
Residual factor for significantly intense reflections | 0.0242 |
Weighted residual factors for significantly intense reflections | 0.0639 |
Weighted residual factors for all reflections included in the refinement | 0.0688 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.086 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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