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Information card for entry 4331823
Preview
Coordinates | 4331823.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C38 H40 Fe2 Ga2 N2 |
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Calculated formula | C38 H40 Fe2 Ga2 N2 |
SMILES | [cH]12[c]34[cH]5[cH]6[cH]1[Fe]17892356[cH]2[cH]1[cH]7[cH]8[c]92[Ga]1(c2ccccc2C[N]1(C)C)[c]12[cH]3[cH]5[cH]6[cH]1[Fe]17892356[cH]2[cH]1[cH]7[cH]8[c]92[Ga]14c2ccccc2C[N]1(C)C |
Title of publication | Synthesis, Characterization, and Electrochemical Studies on [1.1]Ferrocenophanes Containing Aluminum, Gallium, and Indium |
Authors of publication | Schachner, Jörg A.; Orlowski, Grzegorz A.; Quail, J. Wilson; Kraatz, Heinz-Bernhard; Müller, Jens |
Journal of publication | Inorganic Chemistry |
Year of publication | 2006 |
Journal volume | 45 |
Journal issue | 1 |
Pages of publication | 454 - 459 |
a | 10.3467 ± 0.0005 Å |
b | 11.6311 ± 0.0004 Å |
c | 14.0747 ± 0.0007 Å |
α | 90° |
β | 105.931 ± 0.002° |
γ | 90° |
Cell volume | 1628.74 ± 0.13 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0818 |
Residual factor for significantly intense reflections | 0.0425 |
Weighted residual factors for significantly intense reflections | 0.0732 |
Weighted residual factors for all reflections included in the refinement | 0.0862 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4331823.html
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Users of the data should acknowledge the original authors of the
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