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Information card for entry 4331873
Preview
Coordinates | 4331873.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C41 H57 Ga N2 O Zr |
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Calculated formula | C41 H57 Ga N2 O Zr |
SMILES | [Zr]12345678(O[Ga]9([N](=C(C)C=C(N9c9c(cccc9C(C)C)C(C)C)C)c9c(cccc9C(C)C)C(C)C)C)([cH]9[cH]4[cH]3[cH]2[cH]19)([cH]1[cH]5[cH]6[cH]7[cH]81)C |
Title of publication | Synthesis, Characterization, and X-ray Crystal Structure of a Gallium Monohydroxide and a Hetero-bimetallic Gallium Zirconium Oxide |
Authors of publication | Singh, Sanjay; Jancik, Vojtech; Roesky, Herbert W.; Herbst-Irmer, Regine |
Journal of publication | Inorganic Chemistry |
Year of publication | 2006 |
Journal volume | 45 |
Journal issue | 3 |
Pages of publication | 949 - 951 |
a | 10.056 ± 0.002 Å |
b | 18.586 ± 0.003 Å |
c | 20.013 ± 0.003 Å |
α | 90° |
β | 90.2 ± 0.02° |
γ | 90° |
Cell volume | 3740.4 ± 1.1 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0222 |
Residual factor for significantly intense reflections | 0.0199 |
Weighted residual factors for significantly intense reflections | 0.0464 |
Weighted residual factors for all reflections included in the refinement | 0.0477 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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