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Information card for entry 4332102
Preview
Coordinates | 4332102.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C65 H71 Cl Ga N2 P2 Rh |
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Calculated formula | C65 H71 Cl Ga N2 P2 Rh |
SMILES | [Rh]1([Ga]2(N(C(=CC(=[N]2c2c(cccc2C(C)C)C(C)C)C)C)c2c(cccc2C(C)C)C(C)C)[Cl]1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Insertion of the Ga(I) Bis-imidinate Ga(DDP) into the Metal Halogen Bonds of Rh(I) Complexes. How Electrophilic Are Coordinated Ga(DDP) Fragments?† |
Authors of publication | Kempter, Andreas; Gemel, Christian; Hardman, Ned J.; Fischer, Roland A. |
Journal of publication | Inorganic Chemistry |
Year of publication | 2006 |
Journal volume | 45 |
Journal issue | 7 |
Pages of publication | 3133 - 3138 |
a | 22.917 ± 0.004 Å |
b | 13.574 ± 0.002 Å |
c | 18.374 ± 0.003 Å |
α | 90° |
β | 98.495 ± 0.015° |
γ | 90° |
Cell volume | 5653 ± 1.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0766 |
Residual factor for significantly intense reflections | 0.0564 |
Weighted residual factors for significantly intense reflections | 0.119 |
Weighted residual factors for all reflections included in the refinement | 0.1288 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.103 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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