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Information card for entry 4333767
Preview
| Coordinates | 4333767.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H18 Cu F3 N4 S5 |
|---|---|
| Calculated formula | C24 H18 Cu F3 N4 S5 |
| SMILES | C1(=N[N]2[Cu]3([N](C(=CC=2C(F)(F)F)c2cccs2)=NC(=[S]3)SCc2ccccc2)S1)SCc1ccccc1 |
| Title of publication | The Trivalent Copper Complex of a Conjugated Bis-dithiocarbazate Schiff Base: Stabilization of Cu in Three Different Oxidation States |
| Authors of publication | Mohammad Akbar Ali; Paul V. Bernhardt; Mathilde A. H. Brax; Jason England; Anthony J. Farlow; Graeme R. Hanson; Lee Len Yeng; Aminul Huq Mirza; Karl Wieghardt |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2013 |
| Journal volume | 52 |
| Pages of publication | 1650 - 1657 |
| a | 5.0358 ± 0.0003 Å |
| b | 13.2672 ± 0.001 Å |
| c | 20.3669 ± 0.001 Å |
| α | 87.617 ± 0.005° |
| β | 85.132 ± 0.004° |
| γ | 79.557 ± 0.005° |
| Cell volume | 1332.89 ± 0.15 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0724 |
| Residual factor for significantly intense reflections | 0.0377 |
| Weighted residual factors for significantly intense reflections | 0.0562 |
| Weighted residual factors for all reflections included in the refinement | 0.0601 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.808 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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