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Information card for entry 4333914
Preview
| Coordinates | 4333914.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H15 Mo N S4 |
|---|---|
| Calculated formula | C15 H15 Mo N S4 |
| SMILES | [Mo]123456789([cH]%10[cH]1[cH]2[cH]3[cH]4%10)([cH]1[cH]8[cH]7[cH]6[cH]51)SC1=C(S9)SC(=S)N1CC |
| Title of publication | Variable Magnetic Interactions between S = 1/2 Cation Radical Salts of Functionalizable Electron-Rich Dithiolene and Diselenolene Cp2Mo Complexes |
| Authors of publication | Talia Bsaibess; Michel Guerro; Yann Le Gal; Daad Sarraf; Nathalie Bellec; Marc Fourmigué; Frédéric Barrière; Vincent Dorcet; Thierry Guizouarn; Thierry Roisnel; Dominique Lorcy |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2013 |
| Journal volume | 52 |
| Pages of publication | 2162 - 2173 |
| a | 11.3067 ± 0.0014 Å |
| b | 12.0229 ± 0.0015 Å |
| c | 12.4471 ± 0.0015 Å |
| α | 90° |
| β | 108.624 ± 0.004° |
| γ | 90° |
| Cell volume | 1603.4 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0303 |
| Residual factor for significantly intense reflections | 0.0262 |
| Weighted residual factors for significantly intense reflections | 0.0593 |
| Weighted residual factors for all reflections included in the refinement | 0.0611 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4333914.html
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Users of the data should acknowledge the original authors of the
structural data.