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Information card for entry 4333985
Preview
Coordinates | 4333985.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H94 Co Na O6 Si4 |
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Calculated formula | C54 H94 Co Na O6 Si4 |
SMILES | [c]12([cH]3[c]4([c]56[c]1([Co]17892346[cH]2[c]1([c]17cccc[c]81[c]29[Si](C)(C)C)[Si](C)(C)C)cccc5)[Si](C)(C)C)[Si](C)(C)C.C1CCC[O]1[Na]([O]1CCCC1)([O]1CCCC1)([O]1CCCC1)([O]1CCCC1)[O]1CCCC1 |
Title of publication | Synthesis of a Bis(indenyl) Co(I) Anion: A Reactive Source of a 14 Electron Indenyl Co(I) Equivalent |
Authors of publication | Fernando Hung-Low; Christopher A. Bradley |
Journal of publication | Inorganic Chemistry |
Year of publication | 2013 |
Journal volume | 52 |
Pages of publication | 2446 - 2457 |
a | 11.4225 ± 0.0002 Å |
b | 14.8087 ± 0.0003 Å |
c | 18.6954 ± 0.0003 Å |
α | 70.642 ± 0.001° |
β | 84.366 ± 0.001° |
γ | 82.92 ± 0.001° |
Cell volume | 2955.29 ± 0.09 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1203 |
Residual factor for significantly intense reflections | 0.0586 |
Weighted residual factors for significantly intense reflections | 0.1257 |
Weighted residual factors for all reflections included in the refinement | 0.1554 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.067 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/4333985.html
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