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Information card for entry 4334041
Preview
Coordinates | 4334041.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H56 N8 Ru2 Si4 |
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Calculated formula | C32 H56 N8 Ru2 Si4 |
SMILES | c12cccc[n]1[RuH]134([Si](C)(N2C)C)([n]2c(cccc2)N(C)[Si]4(C)C)[H][RuH]243([n]3c(cccc3)N(C)[Si]2(C)C)([n]2c(cccc2)N(C)[Si]4(C)C)[H]1 |
Title of publication | Step-by-Step Introduction of Silazane Moieties at Ruthenium: Different Extents of Ru-H-Si Bond Activation |
Authors of publication | Katharine A. Smart; Mary Grellier; Laure Vendier; Sax A. Mason; Silvia C. Capelli; Alberto Albinati; Sylviane Sabo-Etienne |
Journal of publication | Inorganic Chemistry |
Year of publication | 2013 |
Journal volume | 52 |
Pages of publication | 2654 - 2661 |
a | 12.536 ± 0.0002 Å |
b | 12.536 ± 0.0002 Å |
c | 12.8809 ± 0.0002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2024.25 ± 0.06 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 94 |
Hermann-Mauguin space group symbol | P 42 21 2 |
Hall space group symbol | P 4n 2n |
Residual factor for all reflections | 0.0188 |
Residual factor for significantly intense reflections | 0.0156 |
Weighted residual factors for significantly intense reflections | 0.0352 |
Weighted residual factors for all reflections included in the refinement | 0.0356 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.992 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4334041.html
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