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Information card for entry 4334148
Preview
| Coordinates | 4334148.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H36 Cl4 Mo N5 O3 P S3 |
|---|---|
| Calculated formula | C48 H36 Cl4 Mo N5 O3 P S3 |
| SMILES | [Mo]12(SC(=C(S1)C#N)C#N)(Sc1ccc(N(=O)=O)cc1)(=O)[n]1cccc3c1c1[n]2cccc1cc3.[P+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1.ClCCl.ClCCl |
| Title of publication | Oxo-Mo(IV)(dithiolene)thiolato Complexes: Analogue of Reduced Sulfite Oxidase |
| Authors of publication | Joyee Mitra; Sabyasachi Sarkar |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2013 |
| Journal volume | 52 |
| Pages of publication | 3032 - 3042 |
| a | 10.981 ± 0.005 Å |
| b | 12.218 ± 0.005 Å |
| c | 18.179 ± 0.005 Å |
| α | 87.666 ± 0.005° |
| β | 89.071 ± 0.005° |
| γ | 78.301 ± 0.005° |
| Cell volume | 2386.3 ± 1.6 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0641 |
| Residual factor for significantly intense reflections | 0.0533 |
| Weighted residual factors for significantly intense reflections | 0.1604 |
| Weighted residual factors for all reflections included in the refinement | 0.1938 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.819 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4334148.html
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