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Information card for entry 4334540
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Coordinates | 4334540.cif |
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Original paper (by DOI) | HTML |
Common name | Integration of bn_km_76 |
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Formula | C46 H70 N2 Si |
Calculated formula | C46 H70 N2 Si |
SMILES | [Si](=C1N(C(CC21CCCCC2)(C)C)c1c(cccc1C(C)C)C(C)C)=C1N(C(CC21CCCCC2)(C)C)c1c(cccc1C(C)C)C(C)C |
Title of publication | Easy Access to Silicon(0) and Silicon(II) Compounds |
Authors of publication | Kartik Chandra Mondal; Prinson P. Samuel; Mykyta Tretiakov; Amit Pratap Singh; Herbert W. Roesky; A. Claudia Stückl; Benedikt Niepötter; Elena Carl; Hilke Wolf; Regine Herbst-Irmer; Dietmar Stalke |
Journal of publication | Inorganic Chemistry |
Year of publication | 2013 |
Journal volume | 52 |
Pages of publication | 4736 - 4743 |
a | 9.522 ± 0.001 Å |
b | 11.177 ± 0.001 Å |
c | 20.479 ± 0.002 Å |
α | 81.98 ± 0.01° |
β | 89.87 ± 0.01° |
γ | 72.49 ± 0.02° |
Cell volume | 2056.4 ± 0.4 Å3 |
Cell temperature | 101 ± 2 K |
Ambient diffraction temperature | 101 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0569 |
Residual factor for significantly intense reflections | 0.0421 |
Weighted residual factors for significantly intense reflections | 0.1043 |
Weighted residual factors for all reflections included in the refinement | 0.1119 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4334540.html
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Users of the data should acknowledge the original authors of the
structural data.