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Information card for entry 4334820
Preview
Coordinates | 4334820.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C26 H26 F12 Fe P2 Pd Se4 |
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Calculated formula | C26 H26 F12 Fe P2 Pd Se4 |
SMILES | [Pd]123[Se]4CCC[Se]3c3cccc5cccc([Se]1CCC[Se]2[c]12[Fe]6789%10%11%12([cH]1[cH]6[cH]7[cH]28)[c]14[cH]%12[cH]%11[cH]%10[cH]91)c35.[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-] |
Title of publication | Synthesis and Study of Three Novel Macrocyclic Selena[n]ferrocenophanes Containing a Naphthalene Unit |
Authors of publication | Wei Ji; Su Jing; Zeyu Liu; Jing Shen; Jing Ma; Dunru Zhu; Dengke Cao; Limin Zheng; Minxia Yao |
Journal of publication | Inorganic Chemistry |
Year of publication | 2013 |
Journal volume | 52 |
Pages of publication | 5786 - 5793 |
a | 10.6758 ± 0.0019 Å |
b | 11.868 ± 0.002 Å |
c | 13.387 ± 0.002 Å |
α | 75.271 ± 0.003° |
β | 78.638 ± 0.003° |
γ | 83.311 ± 0.003° |
Cell volume | 1604.3 ± 0.5 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0647 |
Residual factor for significantly intense reflections | 0.0552 |
Weighted residual factors for significantly intense reflections | 0.1664 |
Weighted residual factors for all reflections included in the refinement | 0.1743 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.003 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4334820.html
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Users of the data should acknowledge the original authors of the
structural data.