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Information card for entry 4334879
Preview
Coordinates | 4334879.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C68 H92 Ce Li N2 O7 |
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Calculated formula | C68 H92 Ce Li N2 O7 |
SMILES | [Ce]1234([O](c5c(cc(cc5Cc5cc(cc(c5O1)C(C)(C)C)C)C)C(C)(C)C)[Li]([O]2c1c(cc(cc1Cc1cc(cc(c1O3)C(C)(C)C)C)C)C(C)(C)C)([O]1CCCC1)[O]1CCCC1)[n]1ccccc1c1[n]4cccc1.O1CCCC1 |
Title of publication | Synthesis, Electrochemistry, and Reactivity of Cerium(III/IV) Methylene-Bis-Phenolate Complexes |
Authors of publication | Brian D. Mahoney; Nicholas A. Piro; Patrick J. Carroll; Eric J. Schelter |
Journal of publication | Inorganic Chemistry |
Year of publication | 2013 |
Journal volume | 52 |
Pages of publication | 5970 - 5977 |
a | 17.9237 ± 0.0011 Å |
b | 19.409 ± 0.0012 Å |
c | 18.025 ± 0.0012 Å |
α | 90° |
β | 94.044 ± 0.003° |
γ | 90° |
Cell volume | 6254.9 ± 0.7 Å3 |
Cell temperature | 143 ± 1 K |
Ambient diffraction temperature | 143 ± 1 K |
Number of distinct elements | 6 |
Space group number | 7 |
Hermann-Mauguin space group symbol | P 1 n 1 |
Hall space group symbol | P -2yac |
Residual factor for all reflections | 0.0645 |
Residual factor for significantly intense reflections | 0.0584 |
Weighted residual factors for significantly intense reflections | 0.1311 |
Weighted residual factors for all reflections included in the refinement | 0.1349 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.19 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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