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Information card for entry 4334985
Preview
| Coordinates | 4334985.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Al2 Bi4 Br2.54 Cl7.46 Te4 |
|---|---|
| Calculated formula | Al2 Bi4 Br2.538 Cl7.462 Te4 |
| Title of publication | Semiconducting [(Bi4Te4Br2)(Al2Cl6-xBrx)]Cl2 and [Bi2Se2Br](AlCl4): Cationic Chalcogenide Frameworks from Lewis Acidic Ionic Liquids |
| Authors of publication | Kanishka Biswas; In Chung; Jung-Hwan Song; Christos D. Malliakas; Arthur J. Freeman; Mercouri G. Kanatzidis |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2013 |
| Journal volume | 52 |
| Pages of publication | 5657 - 5659 |
| a | 6.966 ± 0.0006 Å |
| b | 8.4658 ± 0.0007 Å |
| c | 11.4626 ± 0.001 Å |
| α | 68.343 ± 0.007° |
| β | 75.142 ± 0.007° |
| γ | 72.289 ± 0.007° |
| Cell volume | 590.5 ± 0.09 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1271 |
| Residual factor for significantly intense reflections | 0.0527 |
| Weighted residual factors for significantly intense reflections | 0.1177 |
| Weighted residual factors for all reflections included in the refinement | 0.1466 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.969 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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