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Information card for entry 4335145
Preview
| Coordinates | 4335145.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H28 O2 P2 S2 W |
|---|---|
| Calculated formula | C22 H28 O2 P2 S2 W |
| SMILES | [W]1(SC(=C(S1)C)C)([P](c1ccccc1)(C)C)([P](c1ccccc1)(C)C)(C#[O])C#[O] |
| Title of publication | Ancillary Ligand Effects upon Dithiolene Redox Noninnocence in Tungsten Bis(dithiolene) Complexes |
| Authors of publication | Yong Yan; Christopher Keating; Perumalreddy Chandrasekaran; Upul Jayarathne; Joel T. Mague; Serena DeBeer; Kyle M. Lancaster; Stephen Sproules; Igor V. Rubtsov; James P. Donahue |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2013 |
| Journal volume | 52 |
| Pages of publication | 6743 - 6751 |
| a | 9.516 ± 0.004 Å |
| b | 15.328 ± 0.006 Å |
| c | 16.853 ± 0.007 Å |
| α | 90° |
| β | 97.849 ± 0.007° |
| γ | 90° |
| Cell volume | 2435.2 ± 1.7 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0196 |
| Residual factor for significantly intense reflections | 0.0182 |
| Weighted residual factors for significantly intense reflections | 0.0436 |
| Weighted residual factors for all reflections included in the refinement | 0.0444 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4335145.html
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