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Information card for entry 4335832
Preview
| Coordinates | 4335832.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C50 H52 B P S Sn |
|---|---|
| Calculated formula | C50 H52 B P S Sn |
| SMILES | [Sn]1(Sc2ccccc2[P]1(C(C)(C)C)C(C)(C)C)(c1ccccc1)c1ccccc1.[B-](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Metal Complexes (M = Zn, Sn, and Pb) of 2-Phosphinobenzenethiolates: Insights into Ligand Folding and Hemilability |
| Authors of publication | Brian M. Barry; Benjamin W. Stein; Christopher A. Larsen; Melissa N. Wirtz; William E. Geiger; Rory Waterman; Richard A. Kemp |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2013 |
| Journal volume | 52 |
| Pages of publication | 9875 - 9884 |
| a | 11.411 ± 0.0016 Å |
| b | 17.15 ± 0.002 Å |
| c | 22.365 ± 0.002 Å |
| α | 78.62 ± 0.007° |
| β | 89.925 ± 0.007° |
| γ | 82.993 ± 0.008° |
| Cell volume | 4257.5 ± 0.9 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0864 |
| Residual factor for significantly intense reflections | 0.0549 |
| Weighted residual factors for significantly intense reflections | 0.1442 |
| Weighted residual factors for all reflections included in the refinement | 0.2006 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.136 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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