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Information card for entry 4336376
Preview
| Coordinates | 4336376.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | VCl(PMe2Ph)2(NtBu)2 |
|---|---|
| Formula | C24 H40 Cl N2 P2 V |
| Calculated formula | C24 H40 Cl N2 P2 V |
| SMILES | C(C)(C)(C)N=[V](=NC(C)(C)C)([P](C)(C)c1ccccc1)([P](C)(C)c1ccccc1)Cl |
| Title of publication | Vanadium Bisimide Bonding Investigated by X-ray Crystallography, 51V and 13C Nuclear Magnetic Resonance Spectroscopy, and V L3,2-Edge X-ray Absorption Near-Edge Structure Spectroscopy |
| Authors of publication | Henry S. La Pierre; Stefan G. Minasian; Mark Abubekerov; Stosh A. Kozimor; David K. Shuh; Tolek Tyliszczak; John Arnold; Robert G. Bergman; F. Dean Toste |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2013 |
| Journal volume | 52 |
| Pages of publication | 11650 - 11660 |
| a | 13.374 ± 0.002 Å |
| b | 12.856 ± 0.002 Å |
| c | 16.237 ± 0.003 Å |
| α | 90° |
| β | 93.158 ± 0.003° |
| γ | 90° |
| Cell volume | 2787.5 ± 0.8 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0504 |
| Residual factor for significantly intense reflections | 0.0352 |
| Weighted residual factors for significantly intense reflections | 0.0981 |
| Weighted residual factors for all reflections included in the refinement | 0.1208 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.138 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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