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Information card for entry 4336970
Preview
Coordinates | 4336970.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C15 H42 Mo6 N6 O35 Se |
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Calculated formula | C15 H24 Mo6 N6 O35 Se |
SMILES | [Mo]123(O[Mo]4([O]2[Se]2=[O]5[Mo]6(O4)([O]=C(C)O[Mo]5(O6)(=O)(=O)O[Mo]45(=O)([O]=C(C)O[Mo](O3)([O]24)(O5)(=O)=O)=O)(=O)=O)(=O)([O]=C(C)O1)=O)(=O)=O.c1c[nH]c[nH+]1.c1[nH]cc[nH+]1.c1[nH]cc[nH+]1.O.O.O.O.O.O.O.O |
Title of publication | Controlled Assembly of Inorganic-Organic Frameworks Based on [SeMo6O21]4- Polyanion |
Authors of publication | Donghui Yang; Suzhi Li; Pengtao Ma; Jingping Wang; Jingyang Niu |
Journal of publication | Inorganic Chemistry |
Year of publication | 2013 |
Journal volume | 52 |
Pages of publication | 14034 - 14039 |
a | 10.6278 ± 0.0006 Å |
b | 10.6429 ± 0.0006 Å |
c | 19.9819 ± 0.0012 Å |
α | 76.261 ± 0.001° |
β | 82.228 ± 0.001° |
γ | 87.064 ± 0.001° |
Cell volume | 2174.9 ± 0.2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0538 |
Residual factor for significantly intense reflections | 0.046 |
Weighted residual factors for significantly intense reflections | 0.1318 |
Weighted residual factors for all reflections included in the refinement | 0.1392 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4336970.html
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Users of the data should acknowledge the original authors of the
structural data.