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Information card for entry 4337390
Preview
Coordinates | 4337390.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | bis(μ~3~-1,2-dithiolatoethane-S,S,S',S')-tetraethanido -bis(triisopropylphosphine)-dicopper(+1)-dialuminium(+3) |
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Formula | C30 H70 Al2 Cu2 P2 S4 |
Calculated formula | C30 H70 Al2 Cu2 P2 S4 |
SMILES | C1C[S]2[Al](CC)(CC)[S]3CC[S]([Al](CC)(CC)[S]1[Cu]2[P](C(C)C)(C(C)C)C(C)C)[Cu]3[P](C(C)C)(C(C)C)C(C)C |
Title of publication | Trialkylphosphine-Stabilized Copper(I) Dialkylaluminum(III) Ethanedithiolate Complexes: Single-Source Precursors and a Novel Modification of Copper Aluminum Disulfide. |
Authors of publication | Kischel, Marcus; Dornberg, Gregor; Krautscheid, Harald |
Journal of publication | Inorganic chemistry |
Year of publication | 2014 |
Journal volume | 53 |
Journal issue | 3 |
Pages of publication | 1614 - 1623 |
a | 11.0435 ± 0.0008 Å |
b | 15.2761 ± 0.0011 Å |
c | 13.2147 ± 0.0011 Å |
α | 90° |
β | 107.84 ± 0.006° |
γ | 90° |
Cell volume | 2122.1 ± 0.3 Å3 |
Cell temperature | 180 ± 2 K |
Ambient diffraction temperature | 180 ± 2 K |
Number of distinct elements | 6 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0445 |
Residual factor for significantly intense reflections | 0.0327 |
Weighted residual factors for significantly intense reflections | 0.0661 |
Weighted residual factors for all reflections included in the refinement | 0.0689 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.922 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4337390.html
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Users of the data should acknowledge the original authors of the
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