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Information card for entry 4337395
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Coordinates | 4337395.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | tetrakis(trimethylphosphine)-copper(+1)-1,2-dithiolatoethane -di(propan-2-ido)-aluminate(+3) |
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Formula | C20 H54 Al Cu P4 S2 |
Calculated formula | C20 H54 Al Cu P4 S2 |
SMILES | C[P](C)(C)[Cu]([P](C)(C)C)([P](C)(C)C)[P](C)(C)C.C1CS[Al](C(C)C)(C(C)C)S1 |
Title of publication | Trialkylphosphine-Stabilized Copper(I) Dialkylaluminum(III) Ethanedithiolate Complexes: Single-Source Precursors and a Novel Modification of Copper Aluminum Disulfide. |
Authors of publication | Kischel, Marcus; Dornberg, Gregor; Krautscheid, Harald |
Journal of publication | Inorganic chemistry |
Year of publication | 2014 |
Journal volume | 53 |
Journal issue | 3 |
Pages of publication | 1614 - 1623 |
a | 9.3435 ± 0.0009 Å |
b | 13.9117 ± 0.0019 Å |
c | 25.887 ± 0.003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3364.9 ± 0.7 Å3 |
Cell temperature | 213 ± 2 K |
Ambient diffraction temperature | 213 ± 2 K |
Number of distinct elements | 6 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.1178 |
Residual factor for significantly intense reflections | 0.0803 |
Weighted residual factors for significantly intense reflections | 0.1901 |
Weighted residual factors for all reflections included in the refinement | 0.2035 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.872 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4337395.html
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