Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4337940
Preview
| Coordinates | 4337940.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C25 H41 Cu N5 O3 S6 |
|---|---|
| Calculated formula | C25 H39 Cu N5 O3 S6 |
| SMILES | [Cu]123([O]=CN(C)C)N(C(=O)C4=C(SC(=C5SC(SC)=C(S5)SC)S4)C(=O)N2CC[NH]3CCCC)CC[NH]1CCCC |
| Title of publication | Effect of Metal Coordination on Photocurrent Response Properties of a Tetrathiafulvalene Organogel Film. |
| Authors of publication | Ji, Shu-Fang; Sun, Yong-Gang; Huo, Peng; Shen, Wei-Chun; Huang, Yu-De; Zhu, Qin-Yu; Dai, Jie |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2014 |
| Journal volume | 53 |
| Journal issue | 7 |
| Pages of publication | 3611 |
| a | 13.661 ± 0.009 Å |
| b | 15.647 ± 0.01 Å |
| c | 17.922 ± 0.012 Å |
| α | 103.56 ± 0.011° |
| β | 112.429 ± 0.015° |
| γ | 89.799 ± 0.003° |
| Cell volume | 3427 ± 4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1541 |
| Residual factor for significantly intense reflections | 0.0905 |
| Weighted residual factors for significantly intense reflections | 0.1492 |
| Weighted residual factors for all reflections included in the refinement | 0.1702 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.126 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4337940.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.