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Information card for entry 4338016
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Coordinates | 4338016.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C239 H165 Cu16 N51 O19 |
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Calculated formula | C239 H159 Cu16 N51 O19 |
SMILES | [Cu]123[O]4[Cu]56[O]7[Cu]89[n]%10n%11[Cu]%12%13([OH2])[n]%14n%15[Cu]%16%17([O](c%18ccccc%18c%18n%17[n]%13c(c%18)c%13nc(ccc%13)c%13n6[n]3c(c%13)c3ccccc3O1)[Cu]1([O]3[Cu]6%13([O]1c1c(cccc1)c1[n]6n%17[Cu]6%18[n]%19n%20[Cu]%21%22[O]([Cu]%23%24[O]%25[Cu]%26(Oc%27ccccc%27c%27n%26[n]%23c(c%27)c%23nc(ccc%23)c%23n%18[n]%13c(c%23)c%13ccccc3%13)[n]3n%13[Cu]%18%23([OH2])[n]%26n%27[Cu]%28%29([O](c%30ccccc%30c%30n%28[n]%23c(c%30)c%23nc(ccc%23)c%23n%24[n]%22c(c%23)c%22ccccc%22O%21)[Cu]%21([O]%22[Cu]%23%24([O]%21c%21c(cccc%21)c%21[n]%23n%28[Cu]%30([OH2])([n]%31n2c(c2c4cccc2)cc%31c2[n]%30c(ccc2)c%28c%21)n2[n]%24c(cc2c2nc(ccc2)c2cc(c4c(O8)cccc4)[n]9n52)c2ccccc2%22)[n]2ccccc2)([O]%29c2ccccc2c%27cc%26c2[n]%18c(ccc2)c%13cc3c2ccccc2%25)[n]2ccccc2)[n]2ccccc2)c2ccccc2c%19cc%20c2[n]6c(ccc2)c%17c1)[n]1ccccc1)([O]%16c1ccccc1c%15cc%14c1[n]%12c(ccc1)c%11cc%10c2ccccc72)[n]1ccccc1)[n]1ccccc1.n1ccccc1.n1ccccc1.n1ccccc1.n1ccccc1.n1ccccc1 |
Title of publication | Linear or Cyclic Clusters of Cu(II) with a Hierarchical Relationship. |
Authors of publication | Craig, Gavin A.; Schütze, Mike; Aguilà, David; Roubeau, Olivier; Ribas-Ariño, Jordi; Vela, Sergi; Teat, Simon J.; Aromí, Guillem |
Journal of publication | Inorganic chemistry |
Year of publication | 2014 |
Journal volume | 53 |
Journal issue | 7 |
Pages of publication | 3290 |
a | 21.968 ± 0.008 Å |
b | 22.557 ± 0.008 Å |
c | 25.407 ± 0.009 Å |
α | 65.291 ± 0.005° |
β | 64.961 ± 0.005° |
γ | 76.157 ± 0.005° |
Cell volume | 10333 ± 6 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.2602 |
Residual factor for significantly intense reflections | 0.202 |
Weighted residual factors for significantly intense reflections | 0.4554 |
Weighted residual factors for all reflections included in the refinement | 0.4771 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.106 |
Diffraction radiation wavelength | 0.7749 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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