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Information card for entry 4338216
Preview
Coordinates | 4338216.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C16 H56 Mn2 N4 Si8 |
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Calculated formula | C16 H56 Mn2 N4 Si8 |
SMILES | C[SiH](C)N([Mn]12[N]([Mn]2(N([SiH](C)C)[SiH](C)C)[N]1([SiH](C)C)[SiH](C)C)([SiH](C)C)[SiH](C)C)[SiH](C)C |
Title of publication | Silylamide Complexes of Chromium(II), Manganese(II), and Cobalt(II) Bearing the Ligands N(SiHMe2)2 and N(SiPhMe2)2. |
Authors of publication | König, Sonja N; Schädle, Christoph; Maichle-Mössmer, Cäcilia; Anwander, Reiner |
Journal of publication | Inorganic chemistry |
Year of publication | 2014 |
Journal volume | 53 |
Journal issue | 9 |
Pages of publication | 4585 - 4597 |
a | 7.975 ± 0.003 Å |
b | 10.783 ± 0.003 Å |
c | 11.595 ± 0.003 Å |
α | 100.84 ± 0.02° |
β | 106.62 ± 0.02° |
γ | 92.48 ± 0.02° |
Cell volume | 933.4 ± 0.5 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1126 |
Residual factor for significantly intense reflections | 0.0777 |
Weighted residual factors for significantly intense reflections | 0.196 |
Weighted residual factors for all reflections included in the refinement | 0.2198 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.085 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4338216.html
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Users of the data should acknowledge the original authors of the
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