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Information card for entry 4338311
Preview
Coordinates | 4338311.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | Tetrammine(fluorido)nitrosyltechnetium(I) hexafluorophosphate x 1/2 KPF6 |
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Formula | F20 H24 K N10 O2 P3 Tc2 |
Calculated formula | F20 H24 K N10 O2 P3 Tc2 |
SMILES | F[Tc](N=O)([NH3])([NH3])([NH3])[NH3].[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].[K+].F[Tc](N=O)([NH3])([NH3])([NH3])[NH3].[P](F)(F)(F)(F)(F)[F-] |
Title of publication | Fluoridonitrosyl Complexes of Technetium(I) and Technetium(II). Synthesis, Characterization, Reactions, and DFT Calculations. |
Authors of publication | Balasekaran, Samundeeswari Mariappan; Spandl, Johann; Hagenbach, Adelheid; Köhler, Klaus; Drees, Markus; Abram, Ulrich |
Journal of publication | Inorganic chemistry |
Year of publication | 2014 |
Journal volume | 53 |
Journal issue | 10 |
Pages of publication | 5117 - 5128 |
a | 12.304 ± 0.001 Å |
b | 12.304 ± 0.001 Å |
c | 8.488 ± 0.001 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1285 ± 0.2 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 7 |
Space group number | 83 |
Hermann-Mauguin space group symbol | P 4/m |
Hall space group symbol | -P 4 |
Residual factor for all reflections | 0.0449 |
Residual factor for significantly intense reflections | 0.04 |
Weighted residual factors for significantly intense reflections | 0.1043 |
Weighted residual factors for all reflections included in the refinement | 0.1067 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.079 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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