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Information card for entry 4338670
Preview
Coordinates | 4338670.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H108 Ce2 N12 Si12 |
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Calculated formula | C36 H108 Ce2 N12 Si12 |
SMILES | C[Si](C)(N([Ce]([N]#N=N[Ce](N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C)(N=N#N)(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C)[Si](C)(C)C)C |
Title of publication | Synthesis and Analysis of a Family of Cerium(IV) Halide and Pseudohalide Compounds. |
Authors of publication | Williams, Ursula J.; Carroll, Patrick J.; Schelter, Eric J. |
Journal of publication | Inorganic chemistry |
Year of publication | 2014 |
Journal volume | 53 |
Journal issue | 12 |
Pages of publication | 6338 - 6345 |
a | 18.515 ± 0.001 Å |
b | 18.515 ± 0.001 Å |
c | 16.7999 ± 0.0009 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 4987.5 ± 0.5 Å3 |
Cell temperature | 100 ± 1 K |
Ambient diffraction temperature | 100 ± 1 K |
Number of distinct elements | 5 |
Space group number | 146 |
Hermann-Mauguin space group symbol | R 3 :H |
Hall space group symbol | R 3 |
Residual factor for all reflections | 0.0126 |
Residual factor for significantly intense reflections | 0.0116 |
Weighted residual factors for significantly intense reflections | 0.0309 |
Weighted residual factors for all reflections included in the refinement | 0.0398 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.257 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4338670.html
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Users of the data should acknowledge the original authors of the
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