Information card for entry 4338865

Structure parameters

• Formula: C32 H52 Fe2 N4 Si4 U
• Calculated formula: C32 H52 Fe2 N4 Si4 U
• SMILES: [U]12(N([Si](C)(C)C)[c]3([cH]4[cH]7[cH]6[cH]53)[Fe]4567389%10[cH]4[cH]3[cH]%10[cH]8[c]94N2[Si](C)(C)C)N([Si](C)(C)C)[c]2([cH]6[cH]5[cH]3[cH]42)[Fe]34562789[cH]3[cH]7[cH]8[cH]9[c]23N1[Si](C)(C)C
• Title of publication: Redox processes in a uranium bis(1,1'-diamidoferrocene) complex.
• Authors of publication: Monreal, Marisa J.; Carver, Colin T.; Diaconescu, Paula L.
• Journal of publication: Inorganic chemistry
• Year of publication: 2007
• Journal volume: 46
• Journal issue: 18
• Pages of publication: 7226 - 7228
• a: 10.0429 ± 0.0008 Å
• b: 21.886 ± 0.0018 Å
• c: 17.025 ± 0.0014 Å
• α: 90°
• β: 90.843 ± 0.001°
• γ: 90°
• Cell volume: 3741.7 ± 0.5 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0574
• Residual factor for significantly intense reflections: 0.0319
• Weighted residual factors for significantly intense reflections: 0.0589
• Weighted residual factors for all reflections included in the refinement: 0.065
• Goodness-of-fit parameter for all reflections included in the refinement: 1.007
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No