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Information card for entry 4339754
Preview
| Coordinates | 4339754.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | technetium-difluoride-dioxide-hexafluoroantimonate |
|---|---|
| Chemical name | technetium-difluoride-dioxide-hexafluoroantimonate |
| Formula | F10 H2 O2 Sb Tc |
| Calculated formula | F10 H2 O2 Sb Tc |
| SMILES | [Tc](F)(F)(=O)(=O)([FH])[F][Sb](F)(F)(F)(F)F.F |
| Title of publication | Technetium fluoride trioxide, TcO3F, preparation and properties. |
| Authors of publication | Supeł, Joanna; Abram, Ulrich; Hagenbach, Adelheid; Seppelt, Konrad |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2007 |
| Journal volume | 46 |
| Journal issue | 14 |
| Pages of publication | 5591 - 5595 |
| a | 8.529 ± 0.002 Å |
| b | 9.038 ± 0.002 Å |
| c | 11.343 ± 0.002 Å |
| α | 90° |
| β | 108.145 ± 0.011° |
| γ | 90° |
| Cell volume | 830.9 ± 0.3 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 20 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0143 |
| Residual factor for significantly intense reflections | 0.0132 |
| Weighted residual factors for significantly intense reflections | 0.0294 |
| Weighted residual factors for all reflections included in the refinement | 0.0297 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.138 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4339754.html
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