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Information card for entry 4339913
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Coordinates | 4339913.cif |
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Original paper (by DOI) | HTML |
Chemical name | bis(triiodogallium(III)){mu2-1,2-bis(diphenylarsino)ethane} |
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Formula | C26 H24 As2 Ga2 I6 |
Calculated formula | C26 H24 As2 Ga2 I6 |
SMILES | [Ga](I)(I)(I)[As](CC[As]([Ga](I)(I)I)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Preparation, characterization, and structural systematics of diphosphane and diarsane complexes of gallium(III) halides. |
Authors of publication | Cheng, Fei; Hector, Andrew L.; Levason, William; Reid, Gillian; Webster, Michael; Zhang, Wenjian |
Journal of publication | Inorganic chemistry |
Year of publication | 2007 |
Journal volume | 46 |
Journal issue | 17 |
Pages of publication | 7215 - 7223 |
a | 10.1666 ± 0.001 Å |
b | 15.4125 ± 0.0015 Å |
c | 23.181 ± 0.002 Å |
α | 90° |
β | 99.036 ± 0.005° |
γ | 90° |
Cell volume | 3587.2 ± 0.6 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0628 |
Residual factor for significantly intense reflections | 0.045 |
Weighted residual factors for significantly intense reflections | 0.0832 |
Weighted residual factors for all reflections included in the refinement | 0.0913 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.149 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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