Information card for entry 4340540

Structure parameters

• Formula: C52 H48 Cl2 F6 P5 W
• Calculated formula: C52 H48 Cl2 F6 P5 W
• Title of publication: X-ray Absorption Spectroscopy Systematics at the Tungsten L-Edge.
• Authors of publication: Jayarathne, Upul; Chandrasekaran, Perumalreddy; Greene, Angelique F.; Mague, Joel T.; DeBeer, Serena; Lancaster, Kyle M.; Sproules, Stephen; Donahue, James P.
• Journal of publication: Inorganic chemistry
• Year of publication: 2014
• Journal volume: 53
• Journal issue: 16
• Pages of publication: 8230 - 8241
• a: 13.2421 ± 0.0008 Å
• b: 19.247 ± 0.0011 Å
• c: 19.638 ± 0.0011 Å
• α: 100.379 ± 0.0001°
• β: 98.995 ± 0.0001°
• γ: 90.907 ± 0.0001°
• Cell volume: 4857.7 ± 0.5 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0668
• Residual factor for significantly intense reflections: 0.0453
• Weighted residual factors for significantly intense reflections: 0.0986
• Weighted residual factors for all reflections included in the refinement: 0.1121
• Goodness-of-fit parameter for all reflections included in the refinement: 1.055
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No