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Information card for entry 4340582
Preview
Coordinates | 4340582.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | [PPh4]2[Ni(Et-thiazdt)2] |
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Formula | C58 H50 N2 Ni P2 S8 |
Calculated formula | C58 H50 N2 Ni P2 S8 |
SMILES | C12=C(N(C(=S)S1)CC)S[Ni]1(S2)SC2=C(N(C(=S)S2)CC)S1.c1(ccccc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1.c1(ccccc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Radical or not radical: compared structures of metal (m = ni, au) bis-dithiolene complexes with a thiazole backbone. |
Authors of publication | Filatre-Furcate, Agathe; Bellec, Nathalie; Jeannin, Olivier; Auban-Senzier, Pascale; Fourmigué, Marc; Vacher, Antoine; Lorcy, Dominique |
Journal of publication | Inorganic chemistry |
Year of publication | 2014 |
Journal volume | 53 |
Journal issue | 16 |
Pages of publication | 8681 - 8690 |
a | 7.4923 ± 0.0015 Å |
b | 12.525 ± 0.003 Å |
c | 14.916 ± 0.004 Å |
α | 98.28 ± 0.02° |
β | 96.835 ± 0.019° |
γ | 99.802 ± 0.018° |
Cell volume | 1350.1 ± 0.6 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0613 |
Residual factor for significantly intense reflections | 0.0385 |
Weighted residual factors for significantly intense reflections | 0.0805 |
Weighted residual factors for all reflections included in the refinement | 0.0907 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.071 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4340582.html
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