Information card for entry 4340676

Structure parameters

• Formula: C37 H35 F20 K N4 O Si3 U
• Calculated formula: C37 H35 F20 K N4 O Si3 U
• SMILES: [U](N(c1c(c(c(c(c1F)F)F)F)F)[Si](C)(C)C)(N(c1c(c(c(c(c1F)F)F)F)F)[Si](C)(C)C)(N(c1c(c(c(c(c1F)F)F)F)F)[Si](C)(C)C)=Nc1c(c(c(c(c1F)F)F)F)F.[K+].O1CCCC1
• Title of publication: Anomalous one-electron processes in the chemistry of uranium nitrogen multiple bonds.
• Authors of publication: Mullane, Kimberly C.; Lewis, Andrew J.; Yin, Haolin; Carroll, Patrick J.; Schelter, Eric J.
• Journal of publication: Inorganic chemistry
• Year of publication: 2014
• Journal volume: 53
• Journal issue: 17
• Pages of publication: 9129 - 9139
• a: 11.3141 ± 0.001 Å
• b: 12.8177 ± 0.0011 Å
• c: 16.7339 ± 0.0015 Å
• α: 89.929 ± 0.004°
• β: 73.205 ± 0.004°
• γ: 85.968 ± 0.004°
• Cell volume: 2317 ± 0.4 ų
• Cell temperature: 143 ± 1 K
• Ambient diffraction temperature: 143 ± 1 K
• Number of distinct elements: 8
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0458
• Residual factor for significantly intense reflections: 0.0356
• Weighted residual factors for significantly intense reflections: 0.0793
• Weighted residual factors for all reflections included in the refinement: 0.0857
• Goodness-of-fit parameter for all reflections included in the refinement: 1.096
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No