Information card for entry 4340678

Structure parameters

• Formula: C36 H36 F20 N4 Si4 U
• Calculated formula: C36 H36 F20 N4 Si4 U
• SMILES: [U](N([Si](C)(C)C)c1c(c(c(c(c1F)F)F)F)F)(N([Si](C)(C)C)c1c(c(c(c(c1F)F)F)F)F)(N([Si](C)(C)C)c1c(c(c(c(c1F)F)F)F)F)N([Si](C)(C)C)c1c(c(c(c(c1F)F)F)F)F
• Title of publication: Anomalous one-electron processes in the chemistry of uranium nitrogen multiple bonds.
• Authors of publication: Mullane, Kimberly C.; Lewis, Andrew J.; Yin, Haolin; Carroll, Patrick J.; Schelter, Eric J.
• Journal of publication: Inorganic chemistry
• Year of publication: 2014
• Journal volume: 53
• Journal issue: 17
• Pages of publication: 9129 - 9139
• a: 10.571 ± 0.003 Å
• b: 12.385 ± 0.003 Å
• c: 19.357 ± 0.005 Å
• α: 85.768 ± 0.01°
• β: 76.166 ± 0.011°
• γ: 68.348 ± 0.01°
• Cell volume: 2286.8 ± 1.1 ų
• Cell temperature: 143 ± 1 K
• Ambient diffraction temperature: 143 ± 1 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0372
• Residual factor for significantly intense reflections: 0.0304
• Weighted residual factors for significantly intense reflections: 0.0923
• Weighted residual factors for all reflections included in the refinement: 0.0974
• Goodness-of-fit parameter for all reflections included in the refinement: 1.301
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No