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Information card for entry 4341318
Preview
Coordinates | 4341318.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | (C6 F7 Xe) (B F4) |
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Formula | C6 B F11 Xe |
Calculated formula | C6 B F11 Xe |
SMILES | [Xe](F)(F)c1c(F)c(F)c(c(c1F)F)F.[B](F)(F)(F)[F-] |
Title of publication | Xenon(IV)-Carbon Bond of [C6F5XeF2](+); Structural Characterization and Bonding of [C6F5XeF2][BF4], [C6F5XeF2][BF4]·2HF, and [C6F5XeF2][BF4]·nNCCH 3 (n = 1, 2); and the Fluorinating Properties of [C6F5XeF2][BF4]. |
Authors of publication | Koppe, Karsten; Haner, Jamie; Mercier, Hélène P A; Frohn, Hermann-J; Schrobilgen, Gary J. |
Journal of publication | Inorganic chemistry |
Year of publication | 2014 |
Journal volume | 53 |
Journal issue | 21 |
Pages of publication | 11640 - 11661 |
a | 7.4707 ± 0.0002 Å |
b | 19.0245 ± 0.0005 Å |
c | 7.7595 ± 0.0002 Å |
α | 90° |
β | 109.873 ± 0.001° |
γ | 90° |
Cell volume | 1037.15 ± 0.05 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0545 |
Residual factor for significantly intense reflections | 0.0459 |
Weighted residual factors for significantly intense reflections | 0.0873 |
Weighted residual factors for all reflections included in the refinement | 0.0887 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.468 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4341318.html
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Users of the data should acknowledge the original authors of the
structural data.