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Information card for entry 4341492
Preview
Coordinates | 4341492.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H78 K N3 O6 Se2 Si6 U |
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Calculated formula | C30 H78 K N3 O6 Se2 Si6 U |
SMILES | C[Si](C)(C)N([Si](C)(C)C)[U]1(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)[Se][Se]1.[K]12345[O]6CC[O]2CC[O]1CC[O]3CC[O]5CC[O]4CC6 |
Title of publication | Synthesis of terminal monochalcogenide and dichalcogenide complexes of uranium using polychalcogenides, [en](2-) (e = te, N = 2; e = se, N = 4), as chalcogen atom transfer reagents. |
Authors of publication | Smiles, Danil E.; Wu, Guang; Hayton, Trevor W. |
Journal of publication | Inorganic chemistry |
Year of publication | 2014 |
Journal volume | 53 |
Journal issue | 19 |
Pages of publication | 10240 - 10247 |
a | 13.2894 ± 0.0006 Å |
b | 17.7878 ± 0.0008 Å |
c | 22.4872 ± 0.0008 Å |
α | 90° |
β | 105.602 ± 0.002° |
γ | 90° |
Cell volume | 5119.9 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 8 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.05 |
Residual factor for significantly intense reflections | 0.0408 |
Weighted residual factors for significantly intense reflections | 0.0916 |
Weighted residual factors for all reflections included in the refinement | 0.0961 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.998 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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