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Information card for entry 4342377
Preview
Coordinates | 4342377.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C43 H28 B F20 P Si2 |
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Calculated formula | C43 H28 B F20 P Si2 |
SMILES | [P+]1([Si](CCC[Si]1(C)C)(C)C)(c1ccccc1)c1ccccc1.[B-](c1c(c(c(c(c1F)F)F)F)F)(c1c(c(c(c(c1F)F)F)F)F)(c1c(c(c(c(c1F)F)F)F)F)c1c(c(c(c(c1F)F)F)F)F |
Title of publication | Cyclic Silylated Onium Ions of Group 15 Elements. |
Authors of publication | Reißmann, Matti; Schäfer, André; Panisch, Robin; Schmidtmann, Marc; Bolte, Michael; Müller, Thomas |
Journal of publication | Inorganic chemistry |
Year of publication | 2015 |
Journal volume | 54 |
Journal issue | 5 |
Pages of publication | 2393 |
a | 15.7053 ± 0.0013 Å |
b | 15.1729 ± 0.0008 Å |
c | 18.6678 ± 0.0016 Å |
α | 90° |
β | 92.505 ± 0.007° |
γ | 90° |
Cell volume | 4444.2 ± 0.6 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0756 |
Residual factor for significantly intense reflections | 0.0596 |
Weighted residual factors for significantly intense reflections | 0.1487 |
Weighted residual factors for all reflections included in the refinement | 0.1587 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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