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Information card for entry 4342553
Preview
| Coordinates | 4342553.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H54 N4 P2 Sn Te2 |
|---|---|
| Calculated formula | C24 H54 N4 P2 Sn Te2 |
| SMILES | C(C)(C)(C)N1P2(=NC(C)(C)C)[Te][Sn](C(C)(C)C)(C(C)(C)C)[Te]P1(=NC(C)(C)C)N2C(C)(C)C |
| Title of publication | [In Process Citation]. |
| Authors of publication | Nordheider, Andreas; Hüll, Katharina; Prentis, Joanna K. D.; Athukorala Arachchige, Kasun S.; Slawin, Alexandra M. Z.; Woollins, J. Derek; Chivers, Tristram |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2015 |
| Journal volume | 54 |
| Journal issue | 6 |
| Pages of publication | 3043 - 3054 |
| a | 20.1157 ± 0.00012 Å |
| b | 30.241 ± 0.0002 Å |
| c | 11.5584 ± 0.0007 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 7031.2 ± 0.4 Å3 |
| Cell temperature | 125 K |
| Ambient diffraction temperature | 125 K |
| Number of distinct elements | 6 |
| Space group number | 43 |
| Hermann-Mauguin space group symbol | F d d 2 |
| Hall space group symbol | F 2 -2d |
| Residual factor for all reflections | 0.0503 |
| Residual factor for significantly intense reflections | 0.0372 |
| Weighted residual factors for significantly intense reflections | 0.0554 |
| Weighted residual factors for all reflections included in the refinement | 0.0584 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.062 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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