Information card for entry 4342864

Structure parameters

• Common name: compound 4
• Formula: C48 H41 Mo2 N O5 P2 Pt S
• Calculated formula: C48 H41 Mo2 N O5 P2 Pt S
• SMILES: [Pt]123([Mo]4567(C2=O)(C3=O)(C#[O])[cH]2[cH]4[cH]5[cH]6[cH]72)([S](CCN2[P]1([Mo]1345([P]2(c2ccccc2)c2ccccc2)(C#[O])(C#[O])[cH]2[cH]3[cH]5[cH]4[cH]12)c1ccccc1)Cc1ccccc1)c1ccccc1
• Title of publication: Sulfur-Assisted Phenyl Migration from Phosphorus to Platinum in PtW2 and PtMo2 Clusters Containing Thioether-Functionalized Short-Bite Ligands of the Bis(diphenylphosphanyl)amine-Type.
• Authors of publication: Todisco, Stefano; Mastrorilli, Piero; Latronico, Mario; Gallo, Vito; Englert, Ulli; Re, Nazzareno; Creati, Francesco; Braunstein, Pierre
• Journal of publication: Inorganic chemistry
• Year of publication: 2015
• Journal volume: 54
• Journal issue: 10
• Pages of publication: 4777 - 4798
• a: 8.9112 ± 0.0009 Å
• b: 12.4727 ± 0.0013 Å
• c: 20.138 ± 0.002 Å
• α: 87.646 ± 0.002°
• β: 87.333 ± 0.002°
• γ: 80.118 ± 0.002°
• Cell volume: 2201.4 ± 0.4 ų
• Cell temperature: 193 ± 2 K
• Ambient diffraction temperature: 193 ± 2 K
• Number of distinct elements: 8
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0584
• Residual factor for significantly intense reflections: 0.0398
• Weighted residual factors for significantly intense reflections: 0.0602
• Weighted residual factors for all reflections included in the refinement: 0.0644
• Goodness-of-fit parameter for all reflections included in the refinement: 1.005
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No