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Information card for entry 4342948
Preview
Coordinates | 4342948.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C39 H38 F12 N8 O4 P2 Ru |
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Calculated formula | C39 H38 F12 N8 O4 P2 Ru |
SMILES | [Ru]123([OH2])([N](c4ccc(OC)cc4)=C4C(=[N]2c2ccc(OC)cc2)c2c5c4cccc5ccc2)[n]2n(ccc2)C(n2ccc[n]32)n2[n]1ccc2.[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-].O=C(C)C |
Title of publication | Tunable Electrochemical and Catalytic Features of BIAN- and BIAO-Derived Ruthenium Complexes. |
Authors of publication | Hazari, Arijit Singha; Das, Ankita; Ray, Ritwika; Agarwala, Hemlata; Maji, Somnath; Mobin, Shaikh M.; Lahiri, Goutam Kumar |
Journal of publication | Inorganic chemistry |
Year of publication | 2015 |
Journal volume | 54 |
Journal issue | 10 |
Pages of publication | 4998 - 5012 |
a | 11.65 ± 0.002 Å |
b | 14.944 ± 0.003 Å |
c | 16.267 ± 0.003 Å |
α | 71.09 ± 0.03° |
β | 69.9 ± 0.03° |
γ | 72.02 ± 0.03° |
Cell volume | 2453.2 ± 1 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0864 |
Residual factor for significantly intense reflections | 0.0584 |
Weighted residual factors for significantly intense reflections | 0.1396 |
Weighted residual factors for all reflections included in the refinement | 0.1508 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.001 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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