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Information card for entry 4343432
Preview
| Coordinates | 4343432.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H54 I2 N O5 U |
|---|---|
| Calculated formula | C36 H54 I2 N O5 U |
| SMILES | [U]12(I)(I)(Oc3c4N2c2c(O1)c(cc(c2Oc4c(cc3C(C)(C)C)C(C)(C)C)C(C)(C)C)C(C)(C)C)([O]1CCCC1)[O]1CCCC1 |
| Title of publication | Spectroscopic and Structural Elucidation of Uranium Dioxophenoxazine Complexes. |
| Authors of publication | Pattenaude, Scott A.; Kuehner, Christopher S.; Dorfner, Walter L.; Schelter, Eric J.; Fanwick, Phillip E.; Bart, Suzanne C. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2015 |
| Journal volume | 54 |
| Journal issue | 13 |
| Pages of publication | 6520 - 6527 |
| a | 17.367 ± 0.0006 Å |
| b | 17.7559 ± 0.0007 Å |
| c | 17.2211 ± 0.0004 Å |
| α | 90° |
| β | 110.85 ± 0.002° |
| γ | 90° |
| Cell volume | 4962.7 ± 0.3 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0817 |
| Residual factor for significantly intense reflections | 0.0464 |
| Weighted residual factors for significantly intense reflections | 0.1055 |
| Weighted residual factors for all reflections included in the refinement | 0.1203 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4343432.html
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