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Information card for entry 4343701
Preview
Coordinates | 4343701.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C46 H42 N6 Ni2 O2 S4 |
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Calculated formula | C46 H42 N6 Ni2 O2 S4 |
SMILES | C1c2c(S[Ni]34[N]=1c1cccc([N]5=Cc6c(cccc6)S[Ni]65Sc5c(C=[N]6c6cccc([N]3=Cc3c(S4)cccc3)c6)cccc5)c1)cccc2.C(=O)N(C)C.C(=O)N(C)C |
Title of publication | Reversible Formation and Transmetalation of Schiff-Base Complexes in Subcomponent Self-Assembly Reactions. |
Authors of publication | Lewing, Dennis; Koppetz, Hannah; Hahn, F. Ekkehardt |
Journal of publication | Inorganic chemistry |
Year of publication | 2015 |
Journal volume | 54 |
Journal issue | 15 |
Pages of publication | 7653 - 7659 |
a | 9.5835 ± 0.0005 Å |
b | 11.9723 ± 0.0006 Å |
c | 18.4742 ± 0.0009 Å |
α | 90° |
β | 102.351 ± 0.001° |
γ | 90° |
Cell volume | 2070.61 ± 0.18 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0561 |
Residual factor for significantly intense reflections | 0.0378 |
Weighted residual factors for significantly intense reflections | 0.0871 |
Weighted residual factors for all reflections included in the refinement | 0.0957 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4343701.html
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Users of the data should acknowledge the original authors of the
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