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Information card for entry 4344089
Preview
| Coordinates | 4344089.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C4 H6 Ce4 Cs1.5 Na8.5 O97.5 Si2 W18 |
|---|---|
| Calculated formula | C4 H6 Ce4 Cs1.5 Na8.5 O97.5 Si2 W18 |
| Title of publication | Stabilization of Tetravalent 4f (Ce), 5d (Hf), or 5f (Th, U) Clusters by the [α-SiW9O34](10-) Polyoxometalate. |
| Authors of publication | Duval, Sylvain; Béghin, Sébastien; Falaise, Clément; Trivelli, Xavier; Rabu, Pierre; Loiseau, Thierry |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2015 |
| Journal volume | 54 |
| Journal issue | 17 |
| Pages of publication | 8271 - 8280 |
| a | 25.7962 ± 0.0008 Å |
| b | 19.0538 ± 0.0005 Å |
| c | 18.0991 ± 0.0005 Å |
| α | 90° |
| β | 100.523 ± 0.0015° |
| γ | 90° |
| Cell volume | 8746.4 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100.01 K |
| Number of distinct elements | 8 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0318 |
| Residual factor for significantly intense reflections | 0.0271 |
| Weighted residual factors for significantly intense reflections | 0.0611 |
| Weighted residual factors for all reflections included in the refinement | 0.0633 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.093 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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