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Information card for entry 4344695
Preview
Coordinates | 4344695.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C83 H99 N6 O13 P S |
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Calculated formula | C83 H99 N6 O13 P S |
SMILES | S=P12N(N=Cc3cccc(OCCCCOc4c(OC)cc5Cc6c(cc(OC)c(OCCCCOc7cccc(C=NN2C)c7O)c6)Cc2c(cc(OC)c(OCCCCOc6cccc(C=NN1C)c6O)c2)Cc5c4)c3O)C.OCC.c1(ccccc1)C.c1(ccccc1)C.c1(ccccc1)C |
Title of publication | Synthesis and Structural Studies of Gallium(III) and Iron(III) Hemicryptophane Complexes. |
Authors of publication | Gosse, Isabelle; Robeyns, Koen; Bougault, Catherine; Martinez, Alexandre; Tinant, Bernard; Dutasta, Jean-Pierre |
Journal of publication | Inorganic chemistry |
Year of publication | 2016 |
Journal volume | 55 |
Journal issue | 3 |
Pages of publication | 1011 - 1013 |
a | 38.233 ± 0.012 Å |
b | 18.704 ± 0.007 Å |
c | 25.634 ± 0.009 Å |
α | 90° |
β | 115.95 ± 0.03° |
γ | 90° |
Cell volume | 16483 ± 11 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0919 |
Residual factor for significantly intense reflections | 0.0816 |
Weighted residual factors for significantly intense reflections | 0.2353 |
Weighted residual factors for all reflections included in the refinement | 0.2481 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.006 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4344695.html
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Users of the data should acknowledge the original authors of the
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