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Information card for entry 4344753
Preview
| Coordinates | 4344753.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C222 H144 Cl13 N13 Ni12 O44 |
|---|---|
| Calculated formula | C222 H144 Cl13 N13 Ni12 O43.992 |
| Title of publication | "Ligands-with-Benefits": Naphthalene-Substituted Schiff Bases Yielding New Ni(II) Metal Clusters with Ferromagnetic and Emissive Properties and Undergoing Exciting Transformations. |
| Authors of publication | Perlepe, Panagiota S.; Cunha-Silva, Luís; Gagnon, Kevin J.; Teat, Simon J.; Lampropoulos, Christos; Escuer, Albert; Stamatatos, Theocharis C. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2016 |
| Journal volume | 55 |
| Journal issue | 3 |
| Pages of publication | 1270 - 1277 |
| a | 16.9856 ± 0.0006 Å |
| b | 25.1456 ± 0.0011 Å |
| c | 32.8854 ± 0.0013 Å |
| α | 72.694 ± 0.002° |
| β | 84.405 ± 0.002° |
| γ | 83.388 ± 0.002° |
| Cell volume | 13291.1 ± 0.9 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0802 |
| Residual factor for significantly intense reflections | 0.0516 |
| Weighted residual factors for significantly intense reflections | 0.1186 |
| Weighted residual factors for all reflections included in the refinement | 0.1306 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.072 |
| Diffraction radiation wavelength | 0.7749 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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