Information card for entry 4345286

Structure parameters

• Chemical name: T2@MV-2
• Formula: C24 H37 Ge4 N4 O5 S10
• Calculated formula: C24 H37 Ge4 N4 O5 S10
• SMILES: [Ge]12(S[Ge]3(S[Ge](S1)(S[Ge](S3)(S2)[S-])[S-])[S-])[S-].c1[n+](C)ccc(c2cc[n+](cc2)C)c1.[n+]1(C)ccc(c2cc[n+](cc2)C)cc1.O.O.O.O.O
• Title of publication: Substituent-Modulated Assembly Formation: An Approach to Enhancing the Photostability of Photoelectric-Sensitive Chalcogenide-Based Ion-Pair Hybrids.
• Authors of publication: Lin, Jian; Fu, Zhixing; Zhang, Jiaxu; Zhu, Yujia; Hu, Dandan; Li, Dongsheng; Wu, Tao
• Journal of publication: Inorganic chemistry
• Year of publication: 2017
• Journal volume: 56
• Journal issue: 6
• Pages of publication: 3119 - 3122
• a: 9.3893 ± 0.0002 Å
• b: 21.0435 ± 0.0004 Å
• c: 20.2874 ± 0.0005 Å
• α: 90°
• β: 90.333 ± 0.002°
• γ: 90°
• Cell volume: 4008.39 ± 0.15 ų
• Cell temperature: 223 ± 0.1 K
• Ambient diffraction temperature: 223 ± 0.1 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0441
• Residual factor for significantly intense reflections: 0.0285
• Weighted residual factors for significantly intense reflections: 0.0542
• Weighted residual factors for all reflections included in the refinement: 0.0579
• Goodness-of-fit parameter for all reflections included in the refinement: 0.989
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No