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Information card for entry 4345989
Preview
| Coordinates | 4345989.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | Cu2-xTe |
|---|---|
| Formula | Cu31 Te24 |
| Calculated formula | Cu31 Te24 |
| Title of publication | Ab Initio Structure Determination of Cu2–xTe Plasmonic Nanocrystals by Precession-Assisted Electron Diffraction Tomography and HAADF-STEM Imaging |
| Authors of publication | Mugnaioli, Enrico; Gemmi, Mauro; Tu, Renyong; David, Jeremy; Bertoni, Giovanni; Gaspari, Roberto; De Trizio, Luca; Manna, Liberato |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2018 |
| Journal volume | 57 |
| Journal issue | 16 |
| Pages of publication | 10241 - 10248 |
| a | 7.544 ± 0.003 Å |
| b | 22.622 ± 0.007 Å |
| c | 29.797 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5085 ± 3 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 2 |
| Space group number | 17 |
| Hermann-Mauguin space group symbol | P 2 2 21 |
| Hall space group symbol | P 2c 2 |
| Residual factor for all reflections | 0.4757 |
| Residual factor for significantly intense reflections | 0.4655 |
| Weighted residual factors for significantly intense reflections | 0.7306 |
| Weighted residual factors for all reflections included in the refinement | 0.7482 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.66 |
| Diffraction radiation probe | electron |
| Diffraction radiation wavelength | 0.0335 Å |
| Diffraction radiation type | electron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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