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Information card for entry 4346227
Preview
Coordinates | 4346227.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C58 H46 Cl2 N12 O10 Os2 |
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Calculated formula | C58 H46 Cl2 N12 O10 Os2 |
SMILES | [Os]123(Oc4c5c6c(N[Os]78(Oc6c6c4cccc6)([n]4ccccc4c4[n]7cccc4)[n]4c(c6[n]8cccc6)cccc4)ccc5N1)([n]1c(cccc1)c1[n]3cccc1)[n]1ccccc1c1[n]2cccc1.Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-].N#CC.N#CC |
Title of publication | Varying Electronic Structures of Diosmium Complexes from Noninnocently Behaving Anthraquinone-Derived Bis-chelate Ligands. |
Authors of publication | Mandal, Abhishek; Grupp, Anita; Schwederski, Brigitte; Kaim, Wolfgang; Lahiri, Goutam Kumar |
Journal of publication | Inorganic chemistry |
Year of publication | 2015 |
Journal volume | 54 |
Journal issue | 16 |
Pages of publication | 7936 - 7944 |
a | 13.639 ± 0.004 Å |
b | 13.862 ± 0.004 Å |
c | 17.859 ± 0.005 Å |
α | 100.196 ± 0.003° |
β | 110.811 ± 0.002° |
γ | 98.421 ± 0.003° |
Cell volume | 3024.9 ± 1.5 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0562 |
Residual factor for significantly intense reflections | 0.0481 |
Weighted residual factors for significantly intense reflections | 0.1115 |
Weighted residual factors for all reflections included in the refinement | 0.116 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.073 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4346227.html
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