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Information card for entry 4346369
Preview
Coordinates | 4346369.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H72 Cu4 O0 P4 Se8 |
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Calculated formula | C32 H72 Cu4 P4 Se8 |
SMILES | C(C)(C)(C)P1([Se]2[Cu]3456[Se]=P(C(C)(C)C)(C(C)(C)C)[Se]7[Cu]8923[Cu]234([Se]=1)[Cu]578([Se]2P(C(C)(C)C)(C(C)(C)C)=[Se]9)[Se]=P(C(C)(C)C)(C(C)(C)C)[Se]63)C(C)(C)C |
Title of publication | Dithio- and Diselenophosphinate Thorium(IV) and Uranium(IV) Complexes: Molecular and Electronic Structures, Spectroscopy, and Transmetalation Reactivity. |
Authors of publication | Behrle, Andrew C.; Kerridge, Andrew; Walensky, Justin R. |
Journal of publication | Inorganic chemistry |
Year of publication | 2015 |
Journal volume | 54 |
Journal issue | 24 |
Pages of publication | 11625 - 11636 |
a | 20.874 ± 0.003 Å |
b | 18.581 ± 0.003 Å |
c | 16.759 ± 0.002 Å |
α | 90° |
β | 112.976 ± 0.002° |
γ | 90° |
Cell volume | 5984.5 ± 1.5 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0307 |
Residual factor for significantly intense reflections | 0.0203 |
Weighted residual factors for significantly intense reflections | 0.0452 |
Weighted residual factors for all reflections included in the refinement | 0.048 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4346369.html
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