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Information card for entry 4346576
Preview
Coordinates | 4346576.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H72 Al2 Cl20 N2 Si6 |
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Calculated formula | C32 H72 Al2 Cl20 N2 Si6 |
SMILES | C(CCC)[N+](CCCC)(CCCC)CCCC.[Al](Cl)(Cl)(Cl)[Cl-].[Si]1([Si]([Si](Cl)([Si]([Si]([Si]1(Cl)Cl)(Cl)Cl)(Cl)Cl)Cl)(Cl)Cl)(Cl)Cl.C(CCC)[N+](CCCC)(CCCC)CCCC.[Al](Cl)(Cl)(Cl)[Cl-] |
Title of publication | Lewis acidity of Si6Cl12 and its role as convenient SiCl2 source. |
Authors of publication | Tillmann, Jan; Moxter, Maximilian; Bolte, Michael; Lerner, Hans-Wolfram; Wagner, Matthias |
Journal of publication | Inorganic chemistry |
Year of publication | 2015 |
Journal volume | 54 |
Journal issue | 19 |
Pages of publication | 9611 - 9618 |
a | 20.3059 ± 0.0013 Å |
b | 12.0325 ± 0.0005 Å |
c | 27.9854 ± 0.0017 Å |
α | 90° |
β | 103.759 ± 0.005° |
γ | 90° |
Cell volume | 6641.5 ± 0.7 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1001 |
Residual factor for significantly intense reflections | 0.0898 |
Weighted residual factors for significantly intense reflections | 0.2577 |
Weighted residual factors for all reflections included in the refinement | 0.2635 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.105 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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