Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4347364
Preview
Coordinates | 4347364.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H39 B9 Rh2 |
---|---|
Calculated formula | C20 H39 B9 Rh2 |
SMILES | [BH]1234[BH]56[BH]789[BH]%10%11%12[BH]%13%14%15[BH]%16%17[BH]1%13([BH]2%11%15[Rh]12%11%13469%12[c]4([c]%13([c]%11([c]2([c]14C)C)C)C)C)[Rh]1246358%17([BH]7%10%14%16)[c]3([c]1([c]2([c]4([c]63C)C)C)C)C |
Title of publication | Hypoelectronic 8-11-Vertex Irida- and Rhodaboranes. |
Authors of publication | Roy, Dipak Kumar; Borthakur, Rosmita; Prakash, Rini; Bhattacharya, Somnath; Jagan, Rajamony; Ghosh, Sundargopal |
Journal of publication | Inorganic chemistry |
Year of publication | 2016 |
Journal volume | 55 |
Journal issue | 10 |
Pages of publication | 4764 - 4770 |
a | 8.574 ± 0.0002 Å |
b | 14.7851 ± 0.0004 Å |
c | 21.0913 ± 0.0005 Å |
α | 90° |
β | 100.863 ± 0.0012° |
γ | 90° |
Cell volume | 2625.78 ± 0.11 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.051 |
Residual factor for significantly intense reflections | 0.0372 |
Weighted residual factors for significantly intense reflections | 0.0888 |
Weighted residual factors for all reflections included in the refinement | 0.0961 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4347364.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.